- 专利标题： Process and structure to repair damaged probes mounted on a space transformer
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申请号： US09886960申请日： 2001-06-21
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公开(公告)号： US06523255B2公开(公告)日： 2003-02-25
- 发明人: Da-Yuan Shih , Keith Edward Fogel , Paul Alfred Lauro , Brian Samuel Beaman
- 申请人： Da-Yuan Shih , Keith Edward Fogel , Paul Alfred Lauro , Brian Samuel Beaman
- 主分类号： H05K300
- IPC分类号： H05K300
摘要：
Method for repairing, reworking or replacing damaged probes that are formed using a flying lead wire bonding process used for testing integrated circuit devices and other electronic devices, with the same column and row spacing as the original probes and using the same height as the original probes.
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