• Patent Title: Method for fabricating thin film transistor including crystalline silicon active layer
  • Application No.: US09826439
    Application Date: 2001-04-04
  • Publication No.: US06548331B2
    Publication Date: 2003-04-15
  • Inventor: Seok Woon LeeSeung Ki Joo
  • Applicant: Seok Woon LeeSeung Ki Joo
  • Priority: KR2000-72592 20001201
  • Main IPC: H01L2100
  • IPC: H01L2100
Method for fabricating thin film transistor including crystalline silicon active layer
Abstract:
A method for fabricating a TFT including a crystalline silicon active layer is disclosed, in which the metal which induced the crystallization of the active layer is offset from a gate electrode utilizing a mask used to form a lightly doped drain (LDD) region or an offset junction region in the active layer. The TFT includes a silicon active layer crystallized by crystallization inducing metal and a gate electrode, and has an LDD region or an offset junction region formed in the vicinity of the channel region. The method for fabricating the TFT forms a metal offset region without using an additional photoresist forming process, and forms a LDD region by conducting a low density doping in the metal offset region. As a result, a transistor made according to the present invention has low leakage current in its off-state, and has stable electrical characteristics in its on-state.
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