• 专利标题: Method for fabricating thin film transistor including crystalline silicon active layer
  • 申请号: US09826439
    申请日: 2001-04-04
  • 公开(公告)号: US06548331B2
    公开(公告)日: 2003-04-15
  • 发明人: Seok Woon LeeSeung Ki Joo
  • 申请人: Seok Woon LeeSeung Ki Joo
  • 优先权: KR2000-72592 20001201
  • 主分类号: H01L2100
  • IPC分类号: H01L2100
Method for fabricating thin film transistor including crystalline silicon active layer
摘要:
A method for fabricating a TFT including a crystalline silicon active layer is disclosed, in which the metal which induced the crystallization of the active layer is offset from a gate electrode utilizing a mask used to form a lightly doped drain (LDD) region or an offset junction region in the active layer. The TFT includes a silicon active layer crystallized by crystallization inducing metal and a gate electrode, and has an LDD region or an offset junction region formed in the vicinity of the channel region. The method for fabricating the TFT forms a metal offset region without using an additional photoresist forming process, and forms a LDD region by conducting a low density doping in the metal offset region. As a result, a transistor made according to the present invention has low leakage current in its off-state, and has stable electrical characteristics in its on-state.
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