发明授权
- 专利标题: Tuning absorption levels during laser thermal annealing
- 专利标题(中): 调整激光热退火时的吸收水平
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申请号: US10020496申请日: 2001-12-18
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公开(公告)号: US06551888B1公开(公告)日: 2003-04-22
- 发明人: Cyrus E. Tabery , Eric N. Paton , Bin Yu , Qi Xiang , Robert B. Ogle
- 申请人: Cyrus E. Tabery , Eric N. Paton , Bin Yu , Qi Xiang , Robert B. Ogle
- 主分类号: H01L21336
- IPC分类号: H01L21336
摘要:
A method of manufacturing a semiconductor device includes forming a gate electrode over a substrate, introducing dopants into the substrate, forming a tuning layer over at least a portion of the substrate, and activating the dopants using laser thermal annealing. The tuning layer causes an increase or a decrease in the amount of fluence absorbed by the portion of substrate below the tuning layer in comparison to an amount of fluence absorbed by a portion of substrate not covered by the tuning layer. Additional tuning layers can also be formed over the substrate.
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