The drive circuit is formed on a substrate by a first fabrication process and drives a plurality of elements to be driven being formed on the substrate by a second fabrication process which is different from the first fabrication process. The drive circuit includes driver transistors provided between a first signal line and the plurality of elements to be driven, a control circuit for performing on-off control on the driver transistors and a test circuit for testing the drive circuit. The test circuit includes switching elements and resistor elements that are series connected between a second signal line and junctions of the driver transistors and the elements to be driven, respectively, and performs on-off control on the switching elements in response to a control signal. The testing method tests the drive circuit that has been formed on the substrate, before the plurality of elements to be driven are formed on the substrate. The method turns on the switching elements of the test circuit in response to the control signal and performs on-off control on the driver transistors by the control circuit.