发明授权
US06552945B2 METHOD FOR STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD FOR STORING A TEMPERATURE THRESHOLD IN A DYNAMIC RANDOM ACCESS MEMORY, METHOD OF MODIFYING DYNAMIC RANDOM ACCESS MEMORY OPERATION IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT AND MEMORY INTEGRATED CIRCUIT
有权
用于在一体化电路中存储温度阈值的方法，用于在动态随机存取存储器中存储温度阈值的方法，在温度，可编程温度感测电路和存储器集成电路中修改动态随机存取存储器操作的方法
- 专利标题： METHOD FOR STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD FOR STORING A TEMPERATURE THRESHOLD IN A DYNAMIC RANDOM ACCESS MEMORY, METHOD OF MODIFYING DYNAMIC RANDOM ACCESS MEMORY OPERATION IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT AND MEMORY INTEGRATED CIRCUIT
- 专利标题（中）： 用于在一体化电路中存储温度阈值的方法，用于在动态随机存取存储器中存储温度阈值的方法，在温度，可编程温度感测电路和存储器集成电路中修改动态随机存取存储器操作的方法
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申请号： US09768897申请日： 2001-01-23
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公开(公告)号： US06552945B2公开(公告)日： 2003-04-22
- 发明人: Christopher B. Cooper , Ming-Bo Liu , Chris G. Martin , Troy A. Manning , Stephen L. Casper , Charles H. Dennison , Brian M. Shirley , Brian L. Brown , Shubneesh Batra
- 申请人： Christopher B. Cooper , Ming-Bo Liu , Chris G. Martin , Troy A. Manning , Stephen L. Casper , Charles H. Dennison , Brian M. Shirley , Brian L. Brown , Shubneesh Batra
- 主分类号： G11C704
- IPC分类号： G11C704
摘要：
A method for storing a temperature threshold in an integrated circuit includes measuring operating parameters of the integrated circuit versus temperature, calculating a maximum temperature at which the integrated circuit performance exceeds predetermined specifications and storing parameters corresponding to the maximum temperature in a comparison circuit in the integrated circuit by selectively blowing fusable devices in the comparison circuit. The fusable devices may be antifuses. As a result, the integrated circuit is able to provide signals to devices external to the integrated circuit to indicate that the integrated circuit may be too hot to operate properly.
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