- 专利标题: Method for fabricating capacitor electrodes
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申请号: US09924072申请日: 2001-08-07
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公开(公告)号: US06559005B2公开(公告)日: 2003-05-06
- 发明人: Martin Gutsche , Alexander Gschwandtner
- 申请人: Martin Gutsche , Alexander Gschwandtner
- 优先权: DE10038378 20000807
- 主分类号: H01L218242
- IPC分类号: H01L218242
摘要:
The method according to the invention enables the roughness of an HSG surface to be substantially transferred to the surface of an electrode. The electrode consequently acquires a microstructured surface, the area of which can be increased by more than 25%, preferably by more than 50% and particularly preferably by more than 100%. An HSG layer is used to locally mask the electrode surface or the sacrificial layer. Subsequent structuring processes, such as for example wet-chemical and/or plasma-assisted etching processes, nitriding or oxidation processes, make it possible—working on the basis of micromasking effects—to significantly roughen the electrode surface and thereby to increase the electrode surface area.
公开/授权文献
- US20020022316A1 Method for fabricating capacitor electrodes 公开/授权日:2002-02-21
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