发明授权
US06559544B1 Programmable interconnect for semiconductor devices 失效
用于半导体器件的可编程互连

  • 专利标题: Programmable interconnect for semiconductor devices
  • 专利标题(中): 用于半导体器件的可编程互连
  • 申请号: US10107821
    申请日: 2002-03-28
  • 公开(公告)号: US06559544B1
    公开(公告)日: 2003-05-06
  • 发明人: Alan RothCurtis Richardson
  • 申请人: Alan RothCurtis Richardson
  • 主分类号: H01L2940
  • IPC分类号: H01L2940
Programmable interconnect for semiconductor devices
摘要:
A structure for selectively programming interconnections between an input contact and an output contact segment in a multilayer semiconductor, comprising a first group of metal segments each being formed on successive layers of the semiconductor and being interconnected by vias, the first group including the output contact segment; a second group of metal segments each formed on successive layers of the semiconductor and being interconnected by vias, the second group including the input contact segment; and means for connecting a metal segment in the first group to a metal segment in a corresponding layer in the second group, thereby connecting the input contact to the output contact.
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