An insulated gate bipolar transistor (IGBT) and a method for manufacturing the same is provided. This method is capable of preventing a latch-up and improving a short current characteristic. In the IGBT, a second conductive type semiconductor layer is formed over a semiconductor substrate. A first conductive type well is then formed beneath the surface of the semiconductor layer, and a second conductive type source region doped with a high concentration is formed in the well. Also, a gate electrode is formed over the semiconductor layer, but so as not to contact the source region in a region in which a contact between the source region and a cathode electrode is formed. Also, the IGBT further includes an impurity region for controlling latch-up, the impurity region being extended to a part of the semiconductor layer via the well.