- Patent Title: Method and apparatus for measuring optical aberrations of an eye
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Application No.: US09960113Application Date: 2001-09-21
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Publication No.: US06575572B2Publication Date: 2003-06-10
- Inventor: Ming Lai , Jay Wei , Scott A. Meyer , James P. Foley , Jochen M. Horn
- Applicant: Ming Lai , Jay Wei , Scott A. Meyer , James P. Foley , Jochen M. Horn
- Main IPC: A61B310
- IPC: A61B310

Abstract:
Embodiments of the present invention provide a method and apparatus for measurement of aberration of an eye. One or more embodiments provide an aberration measurement instrument that enables measurement wherein Hartmann-Shack spots have reduced speckle; one or more embodiments provide an aberration measurement instrument that enables measurement of an eye having a large diopter power variation over different zones of the eye; one or more embodiments provide an aberration measurement instrument that enables measurement with accommodation control; one or more embodiment provide an aberration measurement instrument wherein radiation reflected by a cornea and radiation scattered by intra-ocular elements are blocked; and one or more embodiment provide an aberration measurement instrument wherein a hazy background produced by radiation multiply scattered within an eye is reduced.
Public/Granted literature
- US20030058403A1 Method and apparatus for measuring optical aberrations of an eye Public/Granted day:2003-03-27
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