发明授权
- 专利标题: Thin film delamination detection for magnetic disks
- 专利标题(中): 磁片薄膜分层检测
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申请号: US10053016申请日: 2001-11-02
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公开(公告)号: US06580266B2公开(公告)日: 2003-06-17
- 发明人: Bradley Frederick Baumgartner , Shanlin Duan , Yan Liu , Bob C. Robinson , Li Tang , Ka Chi Wong
- 申请人: Bradley Frederick Baumgartner , Shanlin Duan , Yan Liu , Bob C. Robinson , Li Tang , Ka Chi Wong
- 主分类号: G01R3312
- IPC分类号: G01R3312
摘要:
An apparatus and method for detecting and marking delamination defects on thin film disks are disclosed. The apparatus includes a read/write (R/W) head and a burnishing head mounted on separate arms that access the disk while spinning on the test stand. The controller uses the R/W head to perform an initial magnetic test of selected areas on the disk to establish an initial defect map. The burnish head is then flown over the surface for an extended time to accelerate and open up the latent delamination defects by impacting protruding material. The R/W head is then used to perform a second magnetic test which is compared against the first test to identify the delamination defects which have been developed by the burnishing. The delamination defects are then marked with a magnetic pattern which aids in optically locating the defect during subsequent failure analysis.
公开/授权文献
- US20030085701A1 THIN FILM DELAMINATION DETECTION 公开/授权日:2003-05-08
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