Invention Grant
US06590955B2 Open chamber-type X-ray analysis apparatus 有权
开放式X射线分析仪

Open chamber-type X-ray analysis apparatus
Abstract:
An open chamber-type X-ray fluorescence analysis apparatus is provided to analyze a large-sized sample located outside the open chamber. The apparatus has a helium inlet provided in the open chamber for injecting helium gas into the chamber to replace gas within the chamber with helium, a film attaching/removing mechanism for covering the opening in the chamber with a film having high transmittance with respect to X-rays, and a gas outlet provided in the chamber for allowing gas to exit the chamber.
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