A testing apparatus is able to test a semiconductor integrated circuit with high observability. The testing apparatus includes a test pattern inputting means 14 for inputting a test pattern for activating a path under test of a semiconductor integrated circuit 20 to the semiconductor integrated circuit, a transient power supply current measuring means 16 for measuring transient power supply current supplied to the semiconductor integrated circuit while the path under test is being activated, and a fault detecting means 34 for judging absence and presence of a fault of the path under test, based on transient power supply current measured by the transient power supply current measuring means.