发明授权
- 专利标题: Method of cutting off circuit under overcurrent, circuit cutting-off device under overcurrent, and method of protecting semiconductor relay system
- 专利标题(中): 过流断路电路,过电流断路装置及半导体继电器保护方法
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申请号: US09667778申请日: 2000-09-22
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公开(公告)号: US06594129B1公开(公告)日: 2003-07-15
- 发明人: Akira Baba , Yoshikazu Nagashima , Kazuto Sugiyama , Yoshihiko Mine
- 申请人: Akira Baba , Yoshikazu Nagashima , Kazuto Sugiyama , Yoshihiko Mine
- 优先权: JP11-269433 19990922; JP11-269446 19990922
- 主分类号: H02H318
- IPC分类号: H02H318
摘要:
In a semiconductor relay system for supply a power source to a lamp load under the on/off control by a microcomputer using a semiconductor relay, a method of cutting off a circuit under an overcurrent, a first prescribed value is which is a current value higher than a rated load current for the load and a maximum current value supplied to the lamp load, and a second prescribed value is set which is a current value between said first prescribed value and said rated current value; the current value flowing through the lamp load is sampled at predetermined time intervals and comparing the current value thus sampled with the second prescribed value; and when a higher current than said first prescribed value flows through the lamp load, the current supplied to the lamp load is controlled within a prescribed range between said first prescribed value and said second prescribed value, and when the sampled current value higher that said second prescribed value is counted by a prescribed number of times, the sampled current is decided as an overcurrent thereby cutting off the semiconductor relay to stop the current supply to said lamp load.