发明授权
US06601205B1 Method to descramble the data mapping in memory circuits 有权
在存储器电路中解扰数据映射的方法

Method to descramble the data mapping in memory circuits
摘要:
An automatic method for the generation of a logical hardware test pattern in memory circuits is based on a given physical pattern. The method includes backwards transformation from a given set of logical data patterns. Since the method is automatic, no knowledge of data scrambling inside the memory circuit is required.
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