发明授权
- 专利标题： Apparatus and method concerning analysis and generation of part program for measuring coordinates and surface properties
- 专利标题（中）： 用于测量坐标和表面性能的零件程序的分析和生成的装置和方法
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申请号： US09529805申请日： 2000-04-20
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公开(公告)号： US06611786B1公开(公告)日： 2003-08-26
- 发明人: Yuwu Zhang , Masayoshi Uneme , Yasushi Fukaya , Kazuo Yamazaki
- 申请人： Yuwu Zhang , Masayoshi Uneme , Yasushi Fukaya , Kazuo Yamazaki
- 主分类号： G06F1900
- IPC分类号： G06F1900
摘要：
In coordinate and surface texture measurement in which measurement control is performed by a part program, a part program is analyzed to extract measurement information or measurement condition. The measurement condition is rewritably stored such that optimal measurement conditions of an actual measurement can be reflected in a part program, and such that the actual measurement conditions can be added to subsequent measurement control.
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