• 专利标题: Sequential chemical vapor deposition
  • 申请号: US09974162
    申请日: 2001-10-09
  • 公开(公告)号: US06616986B2
    公开(公告)日: 2003-09-09
  • 发明人: Arthur Sherman
  • 申请人: Arthur Sherman
  • 主分类号: C23C1606
  • IPC分类号: C23C1606
Sequential chemical vapor deposition
摘要:
The present invention provides for sequential chemical vapor deposition by employing a reactor operated at low pressure, a pump to remove excess reactants, and a line to introduce gas into the reactor through a valve. A first reactant forms a monolayer on the part to be coated, while the second reactant passes through a radical generator which partially decomposes or activates the second reactant into a gaseous radical before it impinges on the monolayer. This second reactant does not necessarily form a monolayer but is available to react with the monolayer. A pump removes the excess second reactant and reaction products completing the process cycle. The process cycle can be repeated to grow the desired thickness of film.
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