Invention Grant
- Patent Title: Method and apparatus for impurity detection
- Patent Title (中): 杂质检测方法和装置
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Application No.: US09561600Application Date: 2000-04-27
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Publication No.: US06629039B1Publication Date: 2003-09-30
- Inventor: Yongdong Wang
- Applicant: Yongdong Wang
- Main IPC: G01N3100
- IPC: G01N3100

Abstract:
A method and apparatus is provided for detecting an impurity in a sample where an index can be calculated to assess purity in the presence of n major components with signal averaging or noise-filtering automatically built-in. The method and apparatus can be applied to liquid chromatography impurity detection using UV-VIS spectrophotometry based on robust matrix algebra representing the entire spectral space generated by the sample.
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