A semiconductor memory device and a method of generating a chip selection signal that enable the analysis of the causes of defects of defective memory devices selected by a user from a system with a plurality of memory devices and the fixing the defects are provided. The semiconductor memory device includes a programming register, an input buffer control circuit, and a chip selection circuit. The programming register activates an output signal in response to an address and a command input from the outside. The input buffer control circuit activates the plurality of data input buffer circuits in response to the output signal of the programming register. The chip selection circuit activates a defect detecting & repairing circuit, such as a repair circuit or a test time shortening circuit, when at least one of output signals of the plurality of data input buffer circuits is in a first logic state.