- 专利标题: Manufacturing method of compound semiconductor wafer
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申请号: US10054844申请日: 2002-01-25
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公开(公告)号: US06649494B2公开(公告)日: 2003-11-18
- 发明人: Satoshi Tamura , Masahiro Ogawa , Masahiro Ishida , Masaaki Yuri
- 申请人: Satoshi Tamura , Masahiro Ogawa , Masahiro Ishida , Masaaki Yuri
- 优先权: JP2001-019547 20010129; JP2001-019551 20010129
- 主分类号: H01L2100
- IPC分类号: H01L2100
摘要:
A protector film is formed on the surface of a substrate to cover at least the side surface thereof. Then, a compound semiconductor film including nitrogen is grown through epitaxial growth on the substrate at an exposed portion. Then, the substrate and the compound semiconductor film are separated from each other by irradiation of laser light, polishing of the substrate, etching, cutting, etc. Consequently, the resulting compound semiconductor film is used as a free-standing wafer.
公开/授权文献
- US20020102819A1 Manufacturing method of compound semiconductor wafer 公开/授权日:2002-08-01
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