- 专利标题: Thin film forming method and apparatus
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申请号: US10259635申请日: 2002-09-30
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公开(公告)号: US06656518B2公开(公告)日: 2003-12-02
- 发明人: Yukihiro Takahashi , Kenichi Shinde
- 申请人: Yukihiro Takahashi , Kenichi Shinde
- 优先权: JP11-292496 19991014; JP11-299829 19991021
- 主分类号: B05D100
- IPC分类号: B05D100
摘要:
To provide a thin film forming method and apparatus that can automatically form thin films having constant optical properties with high reproducibility Antireflection films are deposited on lenses 2a that are held by a coating dome 2 by vaporizing an evaporation material 4 by using an electron gun 3 The power to be applied to the electron gun 3 is controlled so that a transmission or reflection light quantity value that is measured at each time point by an optical film thickness meter 10 becomes equal or approximately equal to a standard light quantity value stored in a standard light quantity value data storing means
公开/授权文献
- US20030029382A1 Thin film forming method and apparatus 公开/授权日:2003-02-13
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