发明授权
- 专利标题: Method and system for quantifying the integrity of an on-chip power supply network
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申请号: US10053197申请日: 2002-01-18
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公开(公告)号: US06665843B2公开(公告)日: 2003-12-16
- 发明人: Roland Frech , Andreas Huber , Erich Klink , Jochen Supper
- 申请人: Roland Frech , Andreas Huber , Erich Klink , Jochen Supper
- 优先权: EP01101309 20010120
- 主分类号: G06F1750
- IPC分类号: G06F1750
摘要:
A method and system for analyzing the dynamic behavior of an electrical circuit to determine whether a voltage level provided by a power supply network drops below a predetermined voltage level during operation of the electrical circuit is described. In a first step, a design data set representing pertinent technical specifications of an electrical or an integrated circuit are read in order to extract location information and value of switching and non-switching capacitance. Next, the circuit and technology propagation speeds are inputted therein. The length for specifying the size of a portion of a circuit area is determined wherein the electrical circuit is formed. Next, the circuit area is divided into a plurality of partitions of a specified size, and the switching capacitance and the non-switching capacitance are separately summarized for each partition. The voltage level drop is then calculated for each partition. Finally, the calculated voltage level drop is displayed in relation to the respective partition. The present method and system can be advantageously used for an on-chip power supply network evaluation as well as for an early chip development process.