发明授权
US06671200B2 Ferroelectric random access memory with isolation transistors coupled between a sense amplifier and an equalization circuit
有权
铁电随机存取存储器,其隔离晶体管耦合在读出放大器和均衡电路之间
- 专利标题: Ferroelectric random access memory with isolation transistors coupled between a sense amplifier and an equalization circuit
- 专利标题(中): 铁电随机存取存储器,其隔离晶体管耦合在读出放大器和均衡电路之间
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申请号: US10372886申请日: 2003-02-26
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公开(公告)号: US06671200B2公开(公告)日: 2003-12-30
- 发明人: Ryu Ogiwara , Daisaburo Takashima , Sumio Tanaka , Yukihito Oowaki , Yoshiaki Takeuchi
- 申请人: Ryu Ogiwara , Daisaburo Takashima , Sumio Tanaka , Yukihito Oowaki , Yoshiaki Takeuchi
- 优先权: JP11-155131 19990602
- 主分类号: G11C1122
- IPC分类号: G11C1122
摘要:
A chain type ferroelectric random access memory has a memory cell unit comprising ferroelectric memory cells electrically connected in series to each other, a plate line connected to an electrode of the memory cell unit, a bit line connected to the other electrode of the memory cell unit via a switching transistor, a sense amplifier which amplifies the voltages of this bit line and its complementary bit line, and a transistor inserted between the switching transistor and the sense amplifier, and that a value, being the minimum value of the gate voltage in the transistor obtained during elevation of the plate line voltage and comparative amplification, is smaller than a value, being the maximum value of the gate voltage in the transistor obtained during fall of the plate line voltage and comparative amplification. With these features, decrease in the accumulated charge of polarization in the memory cell is reduced and occurrence of disturb is prevented during read/write operations.
公开/授权文献
- US20030128572A1 Ferroelectric memory and semiconductor memory 公开/授权日:2003-07-10
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