发明授权
- 专利标题： Ion source and mass spectrometer
- 专利标题（中）： 离子源和质谱仪
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申请号： US09941547申请日： 2001-08-30
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公开(公告)号： US06677582B2公开(公告)日： 2004-01-13
- 发明人: Masuyoshi Yamada , Yasuaki Takada , Masao Suga
- 申请人： Masuyoshi Yamada , Yasuaki Takada , Masao Suga
- 优先权： JP2001-177926 20010613
- 主分类号： H01J4910
- IPC分类号： H01J4910
摘要：
An apparatus for detecting the minor constituents of a sample with high efficiency in positive and negative ion monitoring modes. The directions in which the sample gas is forced to flow in the ionized region within the ion source are properly switched in the positive and negative ion monitoring modes, respectively, thereby enabling both positive ions and negative ions to be detected with high sensitivity.
公开/授权文献
- US20020190201A1 Ion source and mass spectrometer 公开/授权日：2002-12-19
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