发明授权
- 专利标题: Optical characteristic measuring apparatus, the method thereof and recording medium
- 专利标题(中): 光学特性测量装置,其方法和记录介质
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申请号: US09870723申请日: 2001-06-01
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公开(公告)号: US06678041B2公开(公告)日: 2004-01-13
- 发明人: Eiji Kimura , Motoki Imamura , Fumio Inui
- 申请人: Eiji Kimura , Motoki Imamura , Fumio Inui
- 优先权: JPP2000-208220 20000710
- 主分类号: G01N2100
- IPC分类号: G01N2100
摘要:
An apparatus capable of reducing a waveform distortion of outgoing light when light of an optical wavelength in a certain specific narrow range is incident upon optical fiber comprises optical source 10 for supplying the incident light to optical fiber line 110, waveform monitor 42 for measuring a waveform distortion of the transmitted light and adjusting unit 44 for adjusting an output of the incident light so that the measured waveform distortion falls within a predetermined range. By adjusting the output of the incident light, a S/N ration is lowered. Since the noise exists within a relatively wide range of wavelength, the rang of wavelength of the incident light is widened. Therefore, it is possible to reduce the waveform distortion of the outgoing light.
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