发明授权
US06686255B2 Amorphizing ion implant local oxidation of silicon (LOCOS) method for forming an isolation region 失效
非晶化离子注入硅的局部氧化(LOCOS)方法形成隔离区

  • 专利标题: Amorphizing ion implant local oxidation of silicon (LOCOS) method for forming an isolation region
  • 专利标题(中): 非晶化离子注入硅的局部氧化(LOCOS)方法形成隔离区
  • 申请号: US09918010
    申请日: 2001-07-30
  • 公开(公告)号: US06686255B2
    公开(公告)日: 2004-02-03
  • 发明人: Chi-Ming YangFu-Liang Yang
  • 申请人: Chi-Ming YangFu-Liang Yang
  • 主分类号: H01L2176
  • IPC分类号: H01L2176
Amorphizing ion implant local oxidation of silicon (LOCOS) method for forming an isolation region
摘要:
Within a local oxidation of silicon (LOCOS) method for forming a silicon oxide isolation region, there is first amorphized areally completely at least a surface sub-layer portion of a silicon layer within an isolation region location within the silicon layer defined by an oxidation mask layer formed over the silicon layer, to form an amorphized silicon region within the isolation region location. Thus, when thermally oxidizing the silicon layer having formed thereover the oxidation mask layer to form at least in part from the amorphized silicon region a silicon oxide isolation region, the silicon oxide isolation region is formed with an attenuated bird's beak extension.
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