Invention Grant
- Patent Title: Method of sensing temperature of a digital X-ray imaging system
- Patent Title (中): 感测数字X射线成像系统温度的方法
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Application No.: US09683738Application Date: 2002-02-07
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Publication No.: US06713769B2Publication Date: 2004-03-30
- Inventor: Habib Vafi , Richard Gordon Cronce , Scott William Petrick , Jeffrey Alan Kautzer , David Conrad Neumann
- Applicant: Habib Vafi , Richard Gordon Cronce , Scott William Petrick , Jeffrey Alan Kautzer , David Conrad Neumann
- Main IPC: G01T124
- IPC: G01T124

Abstract:
An X-ray imaging system that utilizes the leakage, or dark current, of a detector panel's photodiodes to provide more accurate data about the temperature and spatial distribution of temperature of the X-ray detector panel. Offset images are taken at known temperatures and recorded for each photodiode at two or more known temperatures. A temperature versus offset image value curve is the created for each photodiode. A second offset image value is determined immediately prior to or immediately after X-ray acquisition to determine the temperature of the detector panel at the time of X-ray acquisition. A coupled closed-loop cooling system utilizes the determined temperature to maintain the detector panel within a preferred temperature range.
Public/Granted literature
- US20030146390A1 Method of sensing temperature of a digital X-ray imaging system Public/Granted day:2003-08-07
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