Invention Grant
US06717670B2 High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile 有权
高分辨率立体光谱仪和准同时测定波长和线轮廓的方法

  • Patent Title: High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile
  • Patent Title (中): 高分辨率立体光谱仪和准同时测定波长和线轮廓的方法
  • Application No.: US10168314
    Application Date: 2002-06-20
  • Publication No.: US06717670B2
    Publication Date: 2004-04-06
  • Inventor: Helmut Becker-RossStefan FlorekMichael Okruss
  • Applicant: Helmut Becker-RossStefan FlorekMichael Okruss
  • Priority: DE19961908 19991220
  • Main IPC: G01J318
  • IPC: G01J318
High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile
Abstract:
The invention relates to a spectrometer (10) with a dispersive element (16) that can be displaced between at least two positions. In the first position, the simply dispersed radiation (44) of a selected wavelength is reflected directly back in the incident beam path (42), while in the second position the dispersed radiation (32) of the selected wavelength can be directed to a reflective element (30) that is positioned such that the radiation (34) can be directed at least one more time across the dispersive element (16) and then back to the incident beam path (38). The spectrometer is provided with a device, for example, a mirror, an echelle grating or a prism that deflects the beam from the plane of dispersion, which is arranged in such a manner that the simply dispersed beam (34) runs in another plane than the multiply dispersed beam (36). The mirror (30) is inclined by an axis (54) that extends parallel to the plane of dispersion and perpendicular to the incident beam (32).
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