Invention Grant
US06721690B2 Microscope and method for analyzing acquired scan data 有权
用于分析获取的扫描数据的显微镜和方法

  • Patent Title: Microscope and method for analyzing acquired scan data
  • Patent Title (中): 用于分析获取的扫描数据的显微镜和方法
  • Application No.: US09681051
    Application Date: 2000-12-10
  • Publication No.: US06721690B2
    Publication Date: 2004-04-13
  • Inventor: Frank Olschewski
  • Applicant: Frank Olschewski
  • Main IPC: G06F300
  • IPC: G06F300
Microscope and method for analyzing acquired scan data
Abstract:
A method and system for analyzing acquired scan data are disclosed. The method involves measuring physical values of a particular process, converting the measured values into two signals, such as electrical signals, and then converting the two signals into polar coordinates by defining a vector having a radial magnitude and a vector angle corresponding to the magnitudes of the two signals. The method further provides for validation and visual representation of the measured physical values by employing the angle information to define the upper and lower bounds of the acceptable measured values. The corresponding system comprises sensors measuring the two physical values and yielding the two signals. A signal processing unit receives the two signals, converts them into a pair of polar coordinates defines by the magnitude of the two signals.
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