发明授权
US06730522B1 Method of forming solid of a ferroelectric or high dielectric material and method of manufacturing semiconductor device employing the same 有权
形成铁电体或高介电材料的固体的方法和使用该方法的半导体器件的制造方法

  • 专利标题: Method of forming solid of a ferroelectric or high dielectric material and method of manufacturing semiconductor device employing the same
  • 专利标题(中): 形成铁电体或高介电材料的固体的方法和使用该方法的半导体器件的制造方法
  • 申请号: US09856818
    申请日: 2001-05-25
  • 公开(公告)号: US06730522B1
    公开(公告)日: 2004-05-04
  • 发明人: Takashi NakamuraYoshikazu Fujimori
  • 申请人: Takashi NakamuraYoshikazu Fujimori
  • 优先权: JP10-337323 19981127; JP10-370807 19981225
  • 主分类号: H01L2100
  • IPC分类号: H01L2100
Method of forming solid of a ferroelectric or high dielectric material and method of manufacturing semiconductor device employing the same
摘要:
A method of forming a more satisfactory inorganic compound solid (ferroelectric film or the like) out of organic compound materials containing metal elements by annealing at a relatively low temperature. In order to form a ferroelectric film, a solution of organic compound materials containing metal elements is coated over a semiconductor substrate (S41) and dried (S42), after which precalcining is carried out (S43). After this process is repeated until a predetermined film thickness is achieved, organic substance removing treatment is carried out (S45). The organic substance removing treatment is carried out by, for example, heat treatment (approximately at 550° C.) in a low-pressure atmosphere (approximately at 50 Torr). Post calcining is carried out to inorganic compound materials obtained by the organic substance removing treatment (S46). The post calcining is carried out at a temperature of approximately 550° C., for example, whereby the inorganic compound materials are crystallized.
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