Invention Grant
US06730905B2 Scanning probe microscopy, method of producing the probe, and molecular processing method using the scanning probe microscope
失效
扫描探针显微镜,探针的制作方法和使用扫描探针显微镜的分子处理方法
- Patent Title: Scanning probe microscopy, method of producing the probe, and molecular processing method using the scanning probe microscope
- Patent Title (中): 扫描探针显微镜,探针的制作方法和使用扫描探针显微镜的分子处理方法
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Application No.: US10130569Application Date: 2002-05-17
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Publication No.: US06730905B2Publication Date: 2004-05-04
- Inventor: Tohru Nakagawa , Tetsuo Yukimasa
- Applicant: Tohru Nakagawa , Tetsuo Yukimasa
- Priority: JP2000-286711 20000921
- Main IPC: H01J3726
- IPC: H01J3726

Abstract:
There is provided a probe for a scanning probe microscope, comprising: a proximal end; and a distal tip portion, wherein the distal tip portion has a tip surface which faces a fixed sample, and at least one monolayer is formed at least on the tip surface, and a molecule having a chemical sensor function or catalytic function is placed in or on an outermost monolayer above the tip surface. There is provided a probe for a scanning probe microscope, comprising: a cover layer containing an electrically conductive polymer; and a catalyst in the cover layer, the catalyst being selected from a group consisting of inorganic catalysts and organic catalysts. There are provided a scanning probe microscope equipped with the above probe, and a molecule processing method using such a scanning probe microscope.
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