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US06732054B2 Process for identifying single crystals by electron diffraction 失效
通过电子衍射识别单晶的方法

  • Patent Title: Process for identifying single crystals by electron diffraction
  • Patent Title (中): 通过电子衍射识别单晶的方法
  • Application No.: US10301326
    Application Date: 2002-11-21
  • Publication No.: US06732054B2
    Publication Date: 2004-05-04
  • Inventor: Haskell Vincent Hart
  • Applicant: Haskell Vincent Hart
  • Main IPC: H01J3728
  • IPC: H01J3728
Process for identifying single crystals by electron diffraction
Abstract:
A relational database is built and used for the identification of single crystals by electron diffraction. Selected area electron diffraction (SAED) patterns (a lattice net of spots) produced in an electron diffractometer or a transmission electron microscope (TEM) are matched against database patterns calculated from reduced unit cells of known materials. The effects of double diffraction on electron diffraction patterns are fully incorporated into the database by rigorous calculation.
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