Invention Grant
US06743654B2 Method of fabricating pressure sensor monolithically integrated 有权
制造压力传感器单片集成方法

  • Patent Title: Method of fabricating pressure sensor monolithically integrated
  • Patent Title (中): 制造压力传感器单片集成方法
  • Application No.: US10014880
    Application Date: 2001-12-11
  • Publication No.: US06743654B2
    Publication Date: 2004-06-01
  • Inventor: Salvatore CoffaLuigi Occhipinti
  • Applicant: Salvatore CoffaLuigi Occhipinti
  • Priority: ITVA2000A0042 20001215
  • Main IPC: H01L2100
  • IPC: H01L2100
Method of fabricating pressure sensor monolithically integrated
Abstract:
A method of making a monolithically integrated pressure sensor includes making a cavity in the semiconductor substrate. This may be formed by plasma etching the front side or the back side of the silicon wafer to cut a plurality of trenches or holes deep enough to extend for at least part of its thickness into a doped buried layer of opposite type of conductivity of the substrate and of the epitaxial layer grown over it. The method may also include electrochemically etching through such trenches, and the silicon of the buried layer with an electrolytic solution suitable for selectively etching the doped silicon of the opposite type of conductivity, thereby making the silicon of the buried layer porous. The method may also include oxidizing and leaching away the silicon so made porous.
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