Invention Grant
- Patent Title: System for high throughput analysis
- Patent Title (中): 高通量分析系统
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Application No.: US09942472Application Date: 2001-08-29
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Publication No.: US06750457B2Publication Date: 2004-06-15
- Inventor: David M. Heffelfinger , Aram P. Schiffman , Bala S. Manian
- Applicant: David M. Heffelfinger , Aram P. Schiffman , Bala S. Manian
- Main IPC: G01N2100
- IPC: G01N2100

Abstract:
An apparatus and method in which illumination light and collected emitted light share a pathway and subsequently are physically separated. The optical configuration is designed such that at the point of separation, the illumination light is at has a smaller cross sectional area than the collected light. Collected light is directed away from the pathway of the illumination light and to detection optics. This configuration is adaptable to illumination and light collection across a broad wavelength spectrum. This configuration is adaptable to scanning in a limited depth of field to allow high throughput optical analysis of samples.
Public/Granted literature
- US20030044967A1 System for high throughput analysis Public/Granted day:2003-03-06
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