发明授权
US06754097B2 Read operations on multi-bit memory cells in resistive cross point arrays 有权
读取电阻式交叉点阵列中多位存储单元的操作

  • 专利标题: Read operations on multi-bit memory cells in resistive cross point arrays
  • 专利标题(中): 读取电阻式交叉点阵列中多位存储单元的操作
  • 申请号: US10234511
    申请日: 2002-09-03
  • 公开(公告)号: US06754097B2
    公开(公告)日: 2004-06-22
  • 发明人: Manish SharmaLung T. Tran
  • 申请人: Manish SharmaLung T. Tran
  • 主分类号: G11C1100
  • IPC分类号: G11C1100
Read operations on multi-bit memory cells in resistive cross point arrays
摘要:
A data storage device includes a resistive cross point array of memory cells. Each memory cell includes serially-connected first and second resistive devices. Each resistive device has programmable first and second resistance states. The data storage device further includes pluralities of first, second and third conductors, and a read circuit. Each first conductor is connected to data layers of a column of the first magnetoresistive devices; each second conductor is connected to data layers of a column of second magnetoresistive devices; and each third conductor is between reference layers of a row of first and second magnetoresistive devices. The read circuit applies different first and second voltages during read operations. The first voltage is applied to the first and second conductors crossing a selected memory cell; and the second voltage is applied to the third conductor crossing the selected memory cell.
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