A semiconductor device having ferroelectric memory cells has memory cell transistors each including first and second source/drain regions. Plug electrodes are formed in contact with the first and second source/drain regions, respectively. A ferroelectric capacitor is formed on the plug electrode connected to the first source/drain region. The ferroelectric capacitor includes a first lower electrode formed on the plug electrode, a ferroelectric film formed on the first lower electrode, and an upper electrode formed on the ferroelectric film. A second lower electrode is formed on the plug electrode connected to the second source/drain region. Wiring is formed to connect the upper electrode to the corresponding second lower electrode.