发明授权
US06768102B1 Method and system for recalibration during micro-imaging to determine thermal drift 有权
在微成像期间重新校准的方法和系统以确定热漂移

  • 专利标题: Method and system for recalibration during micro-imaging to determine thermal drift
  • 专利标题(中): 在微成像期间重新校准的方法和系统以确定热漂移
  • 申请号: US09594169
    申请日: 2000-06-15
  • 公开(公告)号: US06768102B1
    公开(公告)日: 2004-07-27
  • 发明人: David F. Skoll
  • 申请人: David F. Skoll
  • 主分类号: G01D1800
  • IPC分类号: G01D1800
Method and system for recalibration during micro-imaging to determine thermal drift
摘要:
A method of recalibrating to compensate for thermal drift between a micro-imaging system and a sample integrated circuit (IC) under investigation determines a planar drift using a cross-correlation between a reference calibration image and a recalibration image, and further determines a focus drift from a difference between a reference focus setting and a recalibration focus setting. The recalibration is performed on detection of a recalibration trigger event, such as expiry of a recalibration time interval. The recalibration time interval can be adaptively adjusted based on a magnitude of the thermal drift. Tile images captured since a last recalibration are recaptured if the thermal drift is too great for reliable image compensation. The system ensures seamless assembly of tile images into image photo-mosaics and increases image photo mosaic throughput.
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