Invention Grant
- Patent Title: Method and apparatus for scanned instrument calibration
- Patent Title (中): 用于扫描仪器校准的方法和装置
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Application No.: US10186206Application Date: 2002-06-27
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Publication No.: US06770867B2Publication Date: 2004-08-03
- Inventor: Henri J. Lezec , Christian R. Musil
- Applicant: Henri J. Lezec , Christian R. Musil
- Main IPC: H01J3728
- IPC: H01J3728

Abstract:
Methods and apparatus for calibration of a scanned beam system are provided by sampling a calibration specimen containing an array of targets with a spacing between samples that is greater than the spacing between targets in the array and forming an image from the samples to reduce calibration specimen degradation and to magnify calibration errors to enable very fine calibration of the scanned beam system.
Public/Granted literature
- US20030085352A1 Method and apparatus for scanned instrument calibration Public/Granted day:2003-05-08
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