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US06770867B2 Method and apparatus for scanned instrument calibration 有权
用于扫描仪器校准的方法和装置

Method and apparatus for scanned instrument calibration
Abstract:
Methods and apparatus for calibration of a scanned beam system are provided by sampling a calibration specimen containing an array of targets with a spacing between samples that is greater than the spacing between targets in the array and forming an image from the samples to reduce calibration specimen degradation and to magnify calibration errors to enable very fine calibration of the scanned beam system.
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