发明授权
US06778453B2 METHOD OF STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD OF MODIFYING OPERATION OF DYNAMIC RANDOM ACCESS MEMORY IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT AND MEMORY INTEGRATED CIRCUIT
失效
在集成电路中存储温度阈值的方法，对温度，可编程温度感测电路和存储器集成电路进行动态随机存取存储器操作的修改方法
- 专利标题： METHOD OF STORING A TEMPERATURE THRESHOLD IN AN INTEGRATED CIRCUIT, METHOD OF MODIFYING OPERATION OF DYNAMIC RANDOM ACCESS MEMORY IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT AND MEMORY INTEGRATED CIRCUIT
- 专利标题（中）： 在集成电路中存储温度阈值的方法，对温度，可编程温度感测电路和存储器集成电路进行动态随机存取存储器操作的修改方法
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申请号： US10373498申请日： 2003-02-24
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公开(公告)号： US06778453B2公开(公告)日： 2004-08-17
- 发明人: Christopher B. Cooper , Ming-Bo Liu , Chris G. Martin , Troy A. Manning , Stephen L. Casper , Charles H. Dennison , Brian M. Shirley , Brian L. Brown , Shubneesh Batra
- 申请人： Christopher B. Cooper , Ming-Bo Liu , Chris G. Martin , Troy A. Manning , Stephen L. Casper , Charles H. Dennison , Brian M. Shirley , Brian L. Brown , Shubneesh Batra
- 主分类号： G11C704
- IPC分类号： G11C704
摘要：
A method for storing a temperature threshold in an integrated circuit includes measuring operating parameters of the integrated circuit versus temperature, calculating a maximum temperature at which the integrated circuit performance exceeds predetermined specifications and storing parameters corresponding to the maximum temperature in a comparison circuit in the integrated circuit by selectively blowing fusable devices in the comparison circuit. The fusable devices may be antifuses.
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