发明授权
US06778456B2 Temperature detecting circuit 失效
温度检测电路

  • 专利标题: Temperature detecting circuit
  • 专利标题(中): 温度检测电路
  • 申请号: US10331251
    申请日: 2002-12-30
  • 公开(公告)号: US06778456B2
    公开(公告)日: 2004-08-17
  • 发明人: Saeng Hwan Kim
  • 申请人: Saeng Hwan Kim
  • 优先权: KR10-2002-0042179 20020718
  • 主分类号: G11C700
  • IPC分类号: G11C700
Temperature detecting circuit
摘要:
A temperature detector includes a pulse generator adapted to generate pulse signals based on temperature detecting signals, a first delay circuit adapted to delay the temperature detecting signals in accordance with different delay times and generate a plurality of first delayed signals, a second delay circuit adapted to delay the temperature detecting signals and generate a plurality of second delayed signals, a plurality of detectors adapted to compare the plurality of first delayed signals from the first delay circuit and the plurality of second delayed signals from the second delay circuit and generate compared values based on the pulse signals, a plurality of pads adapted to read outputs generated by the plurality of detectors, and a comparison unit adapted to compare temperature values read from the plurality of pads and current temperature values to determine an optimum detector that generates an optimum temperature value.
公开/授权文献
信息查询
0/0