Invention Grant
- Patent Title: Method for improved cu electroplating in integrated circuit fabrication
- Patent Title (中): 在集成电路制造中改进铜电镀的方法
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Application No.: US10194592Application Date: 2002-07-12
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Publication No.: US06784104B2Publication Date: 2004-08-31
- Inventor: Qing-Tang Jiang , Jiong-Ping Lu
- Applicant: Qing-Tang Jiang , Jiong-Ping Lu
- Main IPC: H10L214763
- IPC: H10L214763

Abstract:
The electroplating of copper is the leading technology for forming copper lines on integrated circuits. In the copper electroplating process a negative potential is applied to the semiconductor wafer with the surface of the semiconductor wafer acting as the cathode. The anode will be partially or wholly formed with copper. Both the anode and the semiconductor will be exposed to a solution comprising copper electrolytes. By reducing the temperature of the copper electrolytes solution below 25° C. the rate of self annealing grain growth will increase reducing the final resistively of the copper lines.
Public/Granted literature
- US20030022493A1 Method for improved cu electroplating in integrated circuit fabrication Public/Granted day:2003-01-30
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