发明授权
- 专利标题: Aqueous dispersion for chemical mechanical polishing
- 专利标题(中): 化学机械抛光用水分散体
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申请号: US10412385申请日: 2003-04-14
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公开(公告)号: US06786944B2公开(公告)日: 2004-09-07
- 发明人: Masayuki Hattori , Michiaki Ando , Kazuo Nishimoto , Nobuo Kawahashi
- 申请人: Masayuki Hattori , Michiaki Ando , Kazuo Nishimoto , Nobuo Kawahashi
- 优先权: JP2002-119890 20020422
- 主分类号: C09G102
- IPC分类号: C09G102
摘要:
An aqueous dispersion for chemical mechanical polishing that is hard to putrefy, scarcely causes scratches, causes only small dishing and is suitable for used in a micro isolating step or a planarizing step of an inter layer dielectric in production of semiconductor devices, which dispersion comprises ceria particles, a preservative composed of a compound having a heterocyclic structure containing a nitrogen atom and a sulfur atom in the ring, such as an isothiazolone compound, and an organic component such as organic abrasive grains composed of resin particles, a dispersing agent composed of a water-soluble polymer having a specific molecular weight or the like, a surfactant and/or an organic acid or a salt thereof contained in an aqueous medium, wherein the ceria particles, preservative and organic component are contained in proportions of 0.1 to 20% by mass, 0.001 to 0.2% by mass and 0.1 to 30% by mass, respectively, when the total proportion of the aqueous medium, ceria particles, preservative and organic component is 100% by mass, and wherein the pH of this aqueous dispersion can be kept in a neutral range.
公开/授权文献
- US20030196386A1 Aqueous dispersion for chemical mechanical polishing 公开/授权日:2003-10-23
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