Invention Grant
- Patent Title: Dimension-measuring column and method for entering a command to switch the measure mode in such a column
- Patent Title (中): 尺寸测量列和输入命令以在此列中切换测量模式的方法
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Application No.: US10314609Application Date: 2002-12-09
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Publication No.: US06813845B2Publication Date: 2004-11-09
- Inventor: Pascal Jordil , Claude Rouge , Charles-Henri Zufferey
- Applicant: Pascal Jordil , Claude Rouge , Charles-Henri Zufferey
- Priority: EP01811221 20011212
- Main IPC: G01B500
- IPC: G01B500

Abstract:
Method enabling a command to switch the measure mode to be entered in a dimension-measuring column (1) provided with a probe tip (44). The command is entered by acting on the angular position of a turning control button, for example by pivoting it until a predetermined angular position. A tactile reaction is perceived by the operator when a predetermined threshold is reached. Advantages: it is possible to enter the commands to switch measuring mode intuitively and without the hands letting go of the turning button.
Public/Granted literature
- US20030106232A1 Dimension-measuring column and method for entering a command to switch the measure mode in such a column Public/Granted day:2003-06-12
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