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US06815373B2 Use of cyclic siloxanes for hardness improvement of low k dielectric films 有权
使用环状硅氧烷来改善低k电介质膜的硬度

Use of cyclic siloxanes for hardness improvement of low k dielectric films
摘要:
A method for depositing a low dielectric constant film having a dielectric constant of about 3.5 or less is provided by blending one or more cyclic organosilicon compounds, one or more aliphatic organosilicon compounds, and one or more low molecular weight aliphatic hydrocarbon compounds. In one aspect, a gas mixture comprising one or more cyclic organosilicon compounds, one or more aliphatic organosilicon compounds, one or more aliphatic hydrocarbon compounds, one or more oxidizing gases, and a carrier gas is reacted at conditions sufficient to deposit a low dielectric constant film on a substrate surface.
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