发明授权
US06815373B2 Use of cyclic siloxanes for hardness improvement of low k dielectric films
有权
使用环状硅氧烷来改善低k电介质膜的硬度
- 专利标题: Use of cyclic siloxanes for hardness improvement of low k dielectric films
- 专利标题(中): 使用环状硅氧烷来改善低k电介质膜的硬度
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申请号: US10124655申请日: 2002-04-16
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公开(公告)号: US06815373B2公开(公告)日: 2004-11-09
- 发明人: Vinita Singh , Srinivas D. Nemani , Yi Zheng , Lihua Li , Tzu-Fang Huang , Li-Qun Xia , Ellie Yieh
- 申请人: Vinita Singh , Srinivas D. Nemani , Yi Zheng , Lihua Li , Tzu-Fang Huang , Li-Qun Xia , Ellie Yieh
- 主分类号: H01L2131
- IPC分类号: H01L2131
摘要:
A method for depositing a low dielectric constant film having a dielectric constant of about 3.5 or less is provided by blending one or more cyclic organosilicon compounds, one or more aliphatic organosilicon compounds, and one or more low molecular weight aliphatic hydrocarbon compounds. In one aspect, a gas mixture comprising one or more cyclic organosilicon compounds, one or more aliphatic organosilicon compounds, one or more aliphatic hydrocarbon compounds, one or more oxidizing gases, and a carrier gas is reacted at conditions sufficient to deposit a low dielectric constant film on a substrate surface.
公开/授权文献
- US20030194880A1 Use of cyclic siloxanes for hardness improvement 公开/授权日:2003-10-16
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