发明授权
US06822327B1 Flip-chip interconnected with increased current-carrying capability
有权
倒装芯片与增加的载流能力相互连接
- 专利标题: Flip-chip interconnected with increased current-carrying capability
- 专利标题(中): 倒装芯片与增加的载流能力相互连接
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申请号: US10461318申请日: 2003-06-13
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公开(公告)号: US06822327B1公开(公告)日: 2004-11-23
- 发明人: Pankaj Mithal , William D. Higdon , Mark W. Gose , John M. Dikeman , Frank Stepniak
- 申请人: Pankaj Mithal , William D. Higdon , Mark W. Gose , John M. Dikeman , Frank Stepniak
- 主分类号: H01L2940
- IPC分类号: H01L2940
摘要:
A metal runner that improves the current-carrying capability of solder bumps used to electrically connect a surface-mount circuit device to a substrate. The runner comprises at least one leg portion and a pad portion, with the pad portion having a continuous region and a plurality of separate electrical paths leading to and from the continuous region. The electrical paths are delineated in the pad portion by nonconductive regions defined in the pad portion, with at least some of the nonconductive regions extending into the leg portion. The multiple electrical paths split the current flow to and from the solder bump, distributing the current around the perimeter of the solder bump in a manner that reduces current density in regions of the solder bump where electromigration is most likely.
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