发明授权
- 专利标题: Pretilt angle measuring method and measuring instrument
- 专利标题(中): 预倾角测量方法和测量仪器
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申请号: US10009937申请日: 2002-06-04
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公开(公告)号: US06822737B2公开(公告)日: 2004-11-23
- 发明人: Tetsuyuki Kurata , Takahiro Nishioka , Yoshihiro Togashi , Susumu Sato
- 申请人: Tetsuyuki Kurata , Takahiro Nishioka , Yoshihiro Togashi , Susumu Sato
- 优先权: JP2000-109889 20000411; JP2000-312529 20001012
- 主分类号: G01J400
- IPC分类号: G01J400
摘要:
An apparatus for detecting a pretilt angle is comprised of a light source 1, a polarizer 2, a liquid-crystal cell 3, a quarter-wave plate 4, an analyzer 5, a photodetector 6, and a processing device. The processing device receives from the photodetector transmitted light intensities of light that is transmitted through the liquid-crystal cell 3 at a plurality of light incident angles. The processing device calculates Stokes parameters corresponding to the plurality of light incident angles based upon the transmitted light intensity corresponding to the plurality of light incident angles. Furthermore, an apparent retardation corresponding to the plurality of light incident angles is determined based upon the Stokes parameters corresponding to the plurality of light incident angles. The pretilt angle of the liquid-crystal cell 3 is determined based upon the determined apparent retardation corresponding to the plurality of light incident angles.
公开/授权文献
- US20030071995A1 Pretilt angle measuring method and measuring instrument 公开/授权日:2003-04-17
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