发明授权
US06825691B1 Apparatus and method for a radiation resistant latch with integrated scan
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具有集成扫描功能的防辐射锁存器的装置和方法
- 专利标题: Apparatus and method for a radiation resistant latch with integrated scan
- 专利标题(中): 具有集成扫描功能的防辐射锁存器的装置和方法
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申请号: US10455163申请日: 2003-06-05
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公开(公告)号: US06825691B1公开(公告)日: 2004-11-30
- 发明人: Sam Gat-Shang Chu , Peter Juergen Klim , Michael Ju Hyeok Lee , Jose Angel Paredes
- 申请人: Sam Gat-Shang Chu , Peter Juergen Klim , Michael Ju Hyeok Lee , Jose Angel Paredes
- 主分类号: H03K19173
- IPC分类号: H03K19173
摘要:
According to one form, a latch has an output node and sublatches. The sublatches each have an output node coupled to input circuitry and feedback circuitry coupled to the sublatch's output node for reinforcing an output signal of the sublatch. The sublatches are operable to receive a data signal at their respective input circuitry and to generate output signals on their respective output nodes. At least one sublatch output node is coupled to the latch output node. The output nodes of other ones of the sublatches are connected in the latch such that if any one of the sublatches is subjected to a radiation induced erroneous change of state the output signals of the other sublatches reduce an effect of the change on the latch output signal. The latch also includes a number of scanning-mode control switches coupled to ones of the sublatches for scanning data in or out.
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