发明授权
US06828656B2 High performance silicon contact for flip chip and a system using same
失效
用于倒装芯片的高性能硅触点和使用相同的系统
- 专利标题: High performance silicon contact for flip chip and a system using same
- 专利标题(中): 用于倒装芯片的高性能硅触点和使用相同的系统
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申请号: US10417222申请日: 2003-04-17
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公开(公告)号: US06828656B2公开(公告)日: 2004-12-07
- 发明人: Leonard Forbes , Kie Y. Ahn
- 申请人: Leonard Forbes , Kie Y. Ahn
- 主分类号: H01L2940
- IPC分类号: H01L2940
摘要:
The present invention provides a semiconductive substrate which includes front and back surfaces and a hole which extends through the substrate and between the front and back surfaces. The hole is defined in part by an interior wall portion and forms an outer conductive sheath. Conductive material is formed proximate at least some of the interior wall portion. Subsequently, a layer of dielectric material is formed within the hole, over and radially inwardly of the conductive material. A second conductive material is then formed within the hole over and radially inwardly of the dielectric material layer. The latter conductive material constitutes an inner conductive coaxial line component.
公开/授权文献
- US20030207566A1 High performance silicon contact for flip chip 公开/授权日:2003-11-06
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