发明授权
- 专利标题: Method for fabricating a semiconductor crystal
- 专利标题(中): 半导体晶体的制造方法
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申请号: US10330080申请日: 2002-12-30
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公开(公告)号: US06838395B1公开(公告)日: 2005-01-04
- 发明人: Yoshihiko Kanzawa , Teruhito Ohnishi , Ken Idota , Tohru Saitoh , Akira Asai
- 申请人: Yoshihiko Kanzawa , Teruhito Ohnishi , Ken Idota , Tohru Saitoh , Akira Asai
- 申请人地址: JP Osaka
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 主分类号: C30B1/00
- IPC分类号: C30B1/00 ; C30B23/02 ; C30B25/02 ; C30B29/52 ; H01L21/205 ; H01L21/31 ; H01L21/322 ; H01L21/324
摘要:
A method for fabricating a semiconductor crystal that has a first step for forming a semiconductor crystal layer (202) that contains carbon atoms and at least one kind of Group IV element other than carbon on a substrate (201), a second step for adding an impurity that is capable of reacting with oxygen to the semiconductor crystal layer (202), and a third step for removing the carbon atoms contained in the semiconductor crystal layer (202) by reacting the carbon with the impurity. This method makes it possible to fabricate a semiconductor crystal substrate in which the concentration of interstitial carbon atoms is satisfactorily reduced, thus resulting in excellent electrical properties when the substrate is applied to a semiconductor device.
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