A mechanical apparatus for testing a plethora of RF devices using test resources that are quickly and easily replaced is disclosed. The mechanical apparatus is located within an RF enclosure, and contains space for one or more test resources, or customizations, to be installed and applied to a device under test (DUT). The mechanical apparatus is coupled to the RF enclosure through a nest plate coupling to a drawer plate. This coupling is made into a tight seal through the use of o-ring elements that enables pneumatic pressure to be made available within the mechanical apparatus. The mechanical apparatus has a stationary base assembly, a lower nest assembly and an upper nest assembly. The DUT may be placed between the upper nest assembly and lower nest assembly, where the upper nest assembly and lower nest assembly may be coupled to test resources that may be applied to the DUT.